Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen

Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen - New York, N.Y : Plenum Press, c1980 - xxvi, 589 p : ill ; 26 cm - NATO advanced study institutes, Physics. v. 63 .

"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

0-306-40628-4 0306406284

oc06942201

80026509 //r905


Crystals--Defects--Congresses
X-ray crystallography--Congresses
Cristales--Defectos
Cristalografía por Rayos X

Con tecnología Koha