Vista normal Vista MARC Vista ISBD

Aven, T,

Stochastic models in reliability / Terje Aven, Uwe Jensen - New York : Springer, c1999 - xii, 270 p ; 24 cm - Applications of mathematics ; 41 .

Includes bibliographical references (p. [253]-265) and index

ISBN: 0-387-98633-2 0387986332, alk. paper

LCCN: 98031039

Subjects--Topical Terms:
Reliability (Engineering)--Mathematical models
Stochastic processes
Procesos estocásticos
Fiabilidad (Ingeniería)--Modelos matemáticos

Dewey Class. No.: 620/.00452/015118