Scanning electron microscopy and x-ray microanalysis/ Joseph I. Goldstein ,/et al./

Scanning electron microscopy and x-ray microanalysis/ Joseph I. Goldstein ,/et al./ - 3rd. ed. - New York : Kluwer Academic/Plenum Press, 2003 - 689 p.

Indices

0306472929


Microanálisis
Espectroscopia

Con tecnología Koha