Vista normal Vista MARC Vista ISBD

Duda, Richard O.

Pattern classification / Richard O. Duda, Peter E. Hart, David G. Stork. - 2nd ed. - New York : Wiley, cop. 2001. - xx, 654 p. : il. ; 27 cm.

"A Wiley-Interscience Publication."

Bibliografía. - índices

Introduction -- Bayesian decision theory -- Maximum-likelihood and Bayesian parameter estimation -- Nonparametric techniques -- Linear discriminant functions -- Multilayer neural networks -- Stochastic methods -- Nonmetric methods -- Algorithm-independent machine learning -- Unsupervised learning and clustering -- Mathematical foundations.

ISBN: 0471056693 (alk. paper)

LCCN: 99029981

Nat. Bib. No.: GB99-V3815

Subjects--Topical Terms:
Pattern recognition systems.
Toma de decisiones
Statistical decision.
Reconocimiento de formas (Informática)

Dewey Class. No.: 006.4