Modelling, Computation and Optimization in Information Systems and Management Sciences Second International Conference MCO 2008, Metz, France - Luxembourg, September 8-10, 2008. Proceedings / edited by Hoai An Le Thi, Pascal Bouvry, Tao Pham Dinh. [Recurso electrónico] :
Le Thi, Hoai An.
Modelling, Computation and Optimization in Information Systems and Management Sciences Second International Conference MCO 2008, Metz, France - Luxembourg, September 8-10, 2008. Proceedings / [Recurso electrónico] : edited by Hoai An Le Thi, Pascal Bouvry, Tao Pham Dinh. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2008. - v.: digital - Communications in Computer and Information Science, 14 1865-0929 ; .
Restringido a usuarios de la UCA
Modo de acceso: World Wide Web
9783540874775
Computer science
Operating systems (Computers)
Computer network architectures
Computer Communication Networks
Data mining
Optical pattern recognition
Information Systems
Computer Science
Computer Systems Organization and Communication Networks
Management of Computing and Information Systems
Computer Communication Networks
Data Mining and Knowledge Discovery
Performance and Reliability
Pattern Recognition
Modelling, Computation and Optimization in Information Systems and Management Sciences Second International Conference MCO 2008, Metz, France - Luxembourg, September 8-10, 2008. Proceedings / [Recurso electrónico] : edited by Hoai An Le Thi, Pascal Bouvry, Tao Pham Dinh. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2008. - v.: digital - Communications in Computer and Information Science, 14 1865-0929 ; .
Restringido a usuarios de la UCA
Modo de acceso: World Wide Web
9783540874775
Computer science
Operating systems (Computers)
Computer network architectures
Computer Communication Networks
Data mining
Optical pattern recognition
Information Systems
Computer Science
Computer Systems Organization and Communication Networks
Management of Computing and Information Systems
Computer Communication Networks
Data Mining and Knowledge Discovery
Performance and Reliability
Pattern Recognition