Handbook of materials characterization / Surender Kumar Sharma, editor ; Dalip Singh Verma, Latif Ullah Khan, Shalendra Kumar, Sher Bahadar Khan, associate editors.

Colaborador(es): Sharma, Surender KumarTipo de material: TextoTextoDetalles de publicación: Cham : Springer, 2018 Descripción: VIII, 613 páginas : ilustraciones, gráficas ; 24 cmISBN: 9783030065553Tema(s): Ciencia de los materialesResumen: This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential part of this book. In addition, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of nanomaterials. The book provides an overview of characterization techniques for a broad readership: from beginners and graduate students, to advanced specialists in both academia and industry.There are a total of 14 chapters.  The first chapter is dedicated to neutron diffraction and covers the fundamental understanding and strategy to characterize magnetic structures. Chapters 2-7 provide concrete information on small angle x-ray scattering, dynamic light scattering, transmission/scanning electron microscopy and scanning force microscopy with special attention to the instrument layout, sample preparation, interpretation of data and applications. Chapters 8-11 are dedicated to optical absorption, infrared spectroscopy, photoluminescence, and Raman scattering with applications to both inorganic and organic materials. Special emphasis is placed to the surface-enhanced Raman scattering approach and Raman scattering for carbon-based materials. Chapters 12-13 focus on the X-ray photoelectron and X-ray absorption spectroscopy methods for the characterization of multifunctional materials. Finally, the chapter 14 offers readers an introduction to 31P solid-state NMR spectroscopy technique for characterization of surface acidic properties of a variety of carbonaceous materials including graphene.
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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential part of this book. In addition, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of nanomaterials. The book provides an overview of characterization techniques for a broad readership: from beginners and graduate students, to advanced specialists in both academia and industry.There are a total of 14 chapters.  The first chapter is dedicated to neutron diffraction and covers the fundamental understanding and strategy to characterize magnetic structures. Chapters 2-7 provide concrete information on small angle x-ray scattering, dynamic light scattering, transmission/scanning electron microscopy and scanning force microscopy with special attention to the instrument layout, sample preparation, interpretation of data and applications. Chapters 8-11 are dedicated to optical absorption, infrared spectroscopy, photoluminescence, and Raman scattering with applications to both inorganic and organic materials. Special emphasis is placed to the surface-enhanced Raman scattering approach and Raman scattering for carbon-based materials. Chapters 12-13 focus on the X-ray photoelectron and X-ray absorption spectroscopy methods for the characterization of multifunctional materials. Finally, the chapter 14 offers readers an introduction to 31P solid-state NMR spectroscopy technique for characterization of surface acidic properties of a variety of carbonaceous materials including graphene.

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