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Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen

NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979. Durham, England).
Contributor(s): Tanner, B. K, Brian Keith | Bowen, D. Keith, David Keith.
Material type: materialTypeLabelBook; Format: print Series: NATO advanced study institutes, Physics. v. 63Series B.Publisher: New York, N.Y : Plenum Press, c1980Description: xxvi, 589 p : ill ; 26 cm.ISBN: 0-306-40628-4; 0306406284.Subject(s): Crystals -- Defects -- Congresses | X-ray crystallography -- Congresses | Cristales -- Defectos | Cristalografía por Rayos X
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Item type Home library Call number Status Loan Date due Barcode Item holds
Monografías 02. BIBLIOTECA CAMPUS PUERTO REAL
548.4/NAT/cha (Browse shelf) Checked out PREST. LIBROS 31/01/2020 3700105240
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"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

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