Normal view MARC view ISBD view

Defect and microstructure analysis by diffraction / Robert L. Snyder, Jaroslav Fiala and Hans J. Bunge

Snyder, Robert L.
Material type: materialTypeLabelBook; Format: print Series: International Union of Crystallography monographs on crystallography 10.Publisher: New York : Oxford University press , 1999Description: 785 p. : il. ; 24 cm.ISBN: 0-19-850189-7.Subject(s): Rayos X -- Difracción | Cristales -- Defectos
Tags from this library: No tags from this library for this title. Log in to add tags.
    average rating: 0.0 (0 votes)

Powered by Koha