Noncontact atomic force microscopy. Vol. 1 / S. Morita, R. Wiesendanger, E. Meyer, (eds.)
Tipo de material:
TextoSeries Nanoscience and technologyDetalles de publicación: Berlin : Springer, 2002 Descripción: XVIII, 439 p. : il. ; 25 cmISBN: 3-540-43117-9Tema(s): Ingeniería nuclear | Nanotecnología | Atomos | Microscopía de fuerza atómicaResumen: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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| Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 621.039/NON (Navegar estantería(Abre debajo)) | Texto completo | Disponible Ubicación en estantería | Bibliomaps® | 374145549X |
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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