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Electron microdiffraction / J.C.H. Spence and J.M. Zuo

Spence, J.C.H.
Contributor(s): Zuo, J.M [coautor].
Material type: materialTypeLabelBook; Format: print Publisher: New York : Plenum Press, 1992Description: 358 p. : gráf. ; 25 cm.ISBN: 0-306-44262-0.Subject(s): Películas delgadas -- Propiedades ópticas | Optica cristalográfica | Electrones -- Difracción | Química del estado sólido
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Item type Home library Call number Status Loan Date due Barcode Item holds
Monografías 02. BIBLIOTECA CAMPUS PUERTO REAL
539.27/SPE/ele (Browse shelf) Checked out PREST. LIBROS 31/01/2020 374145565X
Monografías 02. BIBLIOTECA CAMPUS PUERTO REAL
539.27/SPE/ele (Browse shelf) Checked out PREST. LIBROS 31/01/2020 3743751215
Total holds: 0

Indice

Bibliografía

This comprehensive and practical book offers a concise summary of the current theory and practice of this important microscopy technique. An extensive listing of materials is included as well as several FORTRAN programs and the PostScript code to allow printing of Holz line patterns on a laser printer. The readable text makes this volume valuable for both researchers and graduate students.

INDICE: A brief history of electron microdiffraction. The geometry of CBED patterns. Theory. The measurement of Low-Order structure factors and thickness. Applications of three-and many-beam theory. Large-angle methods. Symmetry determination. Coherent nanoprobes. STEM. Defects and amorphous materials. Instrumentation and experiemtnal technique.

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