Applied measurement with jMetrik / J. Patrick Meyer

By: Meyer, J. Patrick
Material type: TextText; Format: print Publisher: New York : Routledge, 2014Description: XVIII, 149 p. : gráf. ; 23 cmISBN: 0415531977 Subject(s): Psicometría -- Proceso de datos | Tests psicológicos -- Proceso de datos
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Home library Call number Status Loan Date due Barcode Item holds
Monografías 02. BIBLIOTECA CAMPUS PUERTO REAL
159.9.072/MEY/app (Browse shelf) Available   Shelving location | Bibliomaps® PREST. LIBROS 3744606601
Monografías 02. BIBLIOTECA CAMPUS PUERTO REAL
159.9.072/MEY/app (Browse shelf) Checked out PREST. LIBROS 31/01/2022 3744606610
Total holds: 0

Índice

Bibliografía: p. [141]-145

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

There are no comments for this item.

to post a comment.

Powered by Koha