TY  - BOOK
AU  - Morita,S.
AU  - Giessibl,Franz J.
AU  - Wiesendanger,R.
TI  - Noncontact atomic force microscopy
T2  - Nanoscience and technology
SN  - 9783642014949 (hbk.)
PY  - 2009///
CY  - Berlin, London
PB  - Springer
KW  - Ingeniería nuclear
KW  - Nanotecnología
KW  - Atomos
KW  - Microscopía de fuerza atómica
N1  - Introduction.- Method for Precise Force Measurements.- Force Spectroscopy on Semiconductors.- Tip-sample Interactions as a Function of Distance on Insulating Surfaces.- Imaging and Force Spectroscopy on Layered Materials.- Principles and Applications of the qPlus Sensor.- Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atom Manipulation on Insulator Surfaces.- Simulations on Atomic Manipulation on Semiconductor Surfaces.- Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM for Liquid Environment.- Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-
ER  -