TY  - BOOK
AU  - Ross,Richard J.
TI  - Microelectronics failure analysis: desk reference 
SN  - 9781615037254
PY  - 2011///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electrónica
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Handbooks, manuals, etc
KW  - Microelectronics
KW  - Defects
KW  - Electronic apparatus and appliances
KW  - Semiconductors
N1  - Includes bibliographical references and index
ER  -