TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoqing
TI  - VLSI test principles and architectures: design for testability 
T2  - The Morgan Kaufmann series in systems on silicon
SN  - 9780123705976
PY  - 2006///
CY  - Amsterdam, Boston
PB  - Elsevier Morgan Kaufmann Publishers
KW  - Circuitos integrados
KW  - Circuitos integrados en muy gran escala
KW  - Diseño y construccion
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Design
KW  - Circuits intégrés à très grande échelle
KW  - Essais
KW  - Conception et construction
N1  - Includes bibliographical references and index; Chapter 1 Introduction -- Chapter 2 Design for Testability -- Chapter 3 Logic and Fault Simulation -- Chapter 4 Test Generation -- Chapter 5 Logic Built-In Self-Test -- Chapter 6 Test Compression -- Chapter 7 Logic Diagnosis -- Chapter 8 Memory Testing and Built-In Self-Test -- Chapter 9 Memory Diagnosis and Built-In Self-Repair -- Chapter 10 Boundary Scan and Core-Based Testing -- Chapter 11 Analog and Mixed-Signal Testing -- Chapter 12 Test Technology Trends in the Nanometer Age; También disponible en versión electrónica; Consulte en Libros y Revistas electrónicas (http://goo.gl/Ygwy4z); Electronic reproduction; Amsterdam; Elsevier Science & Technology; 2007; Mode of access: World Wide Web; System requirements: Web browser; Title from title screen (viewed on Aug. 2, 2007); Access may be restricted to users at subscribing institutions
N2  - This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website
ER  -