TY  - BOOK
AU  - Hren,John J.
AU  - Goldstein,Joseph I.
AU  - Joy,David C.
ED  - Electron Microscopy Society of America
ED  - Microbeam Analysis Society
TI  - Introduction to analytical electron microscopy
SN  - 0-306-40280-7
U1  - 502.8 
PY  - 1986///
CY  - New York, London
PB  - Plenum Press
KW  - Electron microscope
KW  - Microscopía electrónica
N1  - Sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society; Bibl. - Index
ER  -