TY  - BOOK
AU  - Vickerman,John C.
TI  - Surface analysis: the principal techniques
SN  - 0471972924
PY  - 2004///
CY  - Chichester [etc.]
PB  - : John Wiley & Sons
KW  - Superficies (Tecnología)
KW  - Análisis
KW  - Superficies (Física)
KW  - Química de superficies
KW  - Metodología
N2  - Índice: Introduction. Vacuum technology for applied surface science. Electron spectroscopy for chemical analysis. Auger electron spectroscopy. Secondary ion mass spectrometry-the surface mass spectrometry. Low-energy ion scattering and rutherford backscattering. Vibrational spectroscopy from surfaces. Surface structure determination by interference techniques. Scanning tunnelling microscopy and atomic force microscopy. Index
ER  -