Introduction to focused ion beams : instrumentation, theory, techniques and practice / edited by Lucille A. Giannuzzi, Fred A. Stevie
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TextoDetalles de publicación: New York : Springer, 2004 Descripción: XIV, 357 p. : il. ; 24 cmISBN: 0-387-23116-1Tema(s): Haces de iones focalizados | IonesResumen: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
| Tipo de ítem | Biblioteca de origen | Signatura | URL | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
|---|---|---|---|---|---|---|---|
| Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 544.15/INT (Navegar estantería(Abre debajo)) | Texto completo | Prestado | 31/01/2025 | 374145372X |
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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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