Computational surface and roundness metrology / Bala Muralikrishnan, Jay Raja

Por: Muralikrishnan, BalaColaborador(es): Raja, JayTipo de material: TextoTextoDetalles de publicación: New York : Springer, 2008 Descripción: XX, 263 p. ; 24 cmISBN: 978-1-84800-296-8Tema(s): Superficies (Tecnología)Resumen: Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavours of mathematics that is so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century. Provides a practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysisResumen: Índice: From the contents Part I: Filtering. A Brief History of Filtering.Filtering in Frequency Domains. Time Domain Filtering. Gaussian Filter. 2RC Filter. Filtering Roundness Profiles. Filtering 3D Surfaces.- Part II: Advanced Filtering. Gaussian Regression Filters. Spline Filter. Robust Filters. Envelope and Morphological Filters. Multi-scale Filtering.- Part III: Fitting. Introduction to Fitting Substitute Geometry. Least-squares Best Fit Line and Plane. Non-linear Least-squares I: Introduction. Non-linear Least-squares II: Circle, Sphere and Cylinder. Fitting Radius Suppressed Circle Data. Exchange Algorith... Etc.
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Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavours of mathematics that is so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century. Provides a practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis

Índice: From the contents Part I: Filtering. A Brief History of Filtering.Filtering in Frequency Domains. Time Domain Filtering. Gaussian Filter. 2RC Filter. Filtering Roundness Profiles. Filtering 3D Surfaces.- Part II: Advanced Filtering. Gaussian Regression Filters. Spline Filter. Robust Filters. Envelope and Morphological Filters. Multi-scale Filtering.- Part III: Fitting. Introduction to Fitting Substitute Geometry. Least-squares Best Fit Line and Plane. Non-linear Least-squares I: Introduction. Non-linear Least-squares II: Circle, Sphere and Cylinder. Fitting Radius Suppressed Circle Data. Exchange Algorith... Etc.

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