Handbook of surface and interface analysis : methods for problem-solving / edited by John C. Rivière, Sverre Myhra
Tipo de material:
TextoDetalles de publicación: Boca Raton : CRC Press, 2009 Edición: 2nd ed.Descripción: XX, 651 p. : gráf. ; 26 cmISBN: 978-0-8493-7558-3Tema(s): Química física | Ciencia de los materialesResumen: The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field.Resumen: Índice: Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials.
| Tipo de ítem | Biblioteca de origen | Signatura | URL | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
|---|---|---|---|---|---|---|---|
| Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 620.1/HAN (Navegar estantería(Abre debajo)) | Texto completo | Disponible Ubicación en estantería | Bibliomaps® | 3742711194 |
Índice
Bibliografía
The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field.
Índice: Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials.
No hay comentarios en este titulo.