Peak fitting with CasaXPS : a Casa pocket book / John Walton ... [et al.]
Tipo de material:
TextoDetalles de publicación: Knutsford : Acolyte Science, 2010 Descripción: 132 p. ; 21 cmISBN: 978-0-9549-5331-7Tema(s): Superficies (Tecnología) -- Análisis | Química de superficiesResumen: Peak fitting is one of the most commonly used post acquisition data analysis procedures in XPS, and also the most easily misused. Today the technique is being used in fields far removed from theoretical surface analysis and this volume attempts to encourage and help users from such fields to start out on processing their own data, and in particular to tackle the art of peak fitting, an essential skill in quantitative surface analysis.
| Tipo de ítem | Biblioteca de origen | Signatura | URL | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
|---|---|---|---|---|---|---|---|
| Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 544.7/PEA (Navegar estantería(Abre debajo)) | Texto completo | Prestado | 31/01/2025 | 3743117258 |
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Peak fitting is one of the most commonly used post acquisition data analysis procedures in XPS, and also the most easily misused. Today the technique is being used in fields far removed from theoretical surface analysis and this volume attempts to encourage and help users from such fields to start out on processing their own data, and in particular to tackle the art of peak fitting, an essential skill in quantitative surface analysis.
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