Surface analysis by auger and X-ray photoelectron spectroscopy / edited by David Briggs and John T. Grant
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TextoDetalles de publicación: Manchester : SurfaceSpectra : IM Publications, cop. 2003 Descripción: XI, 899 p. : gráf. ; 26 cmISBN: 1-901019-04-7Tema(s): Espectroscopía | Química de superficiesResumen: Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. All this new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike.Resumen: INDICE: Preface. Dedication. Perspectives and basic principles. 1. Perspectives on XPS and AES. David Briggs and John T. Grant. 2. XPS: Basic Principles, Spectral Features and Qualitative Analysis. David Briggs. 3. AES: Basic Principles, Spectral Features and Qualitative Analysis. John T. Grant. Sample handling, instrumentation and beam effects. 4. Specimen Preparation and Handling. Joseph Geller. 5. XPS: Instrumentation and Performance. Ian W. Drummond. 6. AES Instrumentation and Performance. Masato Kudo. 7. Instrument Calibration for AES and XPS. Martin P. Seah. 8. Analysing Insulators with XPS and AES. Michael... Etc.
| Tipo de ítem | Biblioteca de origen | Signatura | URL | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems | Bibliografía recomendada |
|---|---|---|---|---|---|---|---|---|
| Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 543.42/SUR (Navegar estantería(Abre debajo)) | Texto completo | Prestado | 31/01/2025 | 3741453372 |
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Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. All this new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike.
INDICE: Preface. Dedication. Perspectives and basic principles. 1. Perspectives on XPS and AES. David Briggs and John T. Grant. 2. XPS: Basic Principles, Spectral Features and Qualitative Analysis. David Briggs. 3. AES: Basic Principles, Spectral Features and Qualitative Analysis. John T. Grant. Sample handling, instrumentation and beam effects. 4. Specimen Preparation and Handling. Joseph Geller. 5. XPS: Instrumentation and Performance. Ian W. Drummond. 6. AES Instrumentation and Performance. Masato Kudo. 7. Instrument Calibration for AES and XPS. Martin P. Seah. 8. Analysing Insulators with XPS and AES. Michael... Etc.
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