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1. Contamination control in trace element analysis / Morris Zief, James W. Mitchell

Zief, Morris | Mitchell, James W.

Material type: book Book Publisher: New York ; London : Wiley, 1976Availability: Items available for reference: 02. BIBLIOTECA CAMPUS PUERTO REAL [Call number: Q’um. Analít. - 543.064:574.2/ZIE/con] (1). Location(s): Q’um. Analít. - 543.064:574.2/ZIE/con.

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2. Metal impurities in silicon-device fabrication / Klaus Graff

Graff, Klaus, 1931-.

Edition: 2nd, rev. edMaterial type: book Book; Format: print Publisher: New York : Springer, 1999Availability: Items available for loan: 03. BIBLIOTECA INGENIERÍA PUERTO REAL (1). Location(s): Depósito-621.315.5/GRA/met.

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