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Microelectronics failure analysis : desk reference / edited by Richard J. Ross. - 6th ed. - Materials Park, Ohio : ASM International, c2011. - xi, 660 p. : ill. ; 28 cm. + 1 CD-ROM (4 3/4 in.)

Includes bibliographical references and index.


System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.

ISBN: 9781615037254

LCCN: 2012359075

Nat. Bib. No.: GBB294807 bnb

Subjects--Topical Terms:
Electrónica
Electronics--Materials--Testing--Handbooks, manuals, etc.
Microelectronics--Materials--Testing--Handbooks, manuals, etc.
Microelectronics--Materials--Defects--Handbooks, manuals, etc.
Electronic apparatus and appliances--Testing--Handbooks, manuals, etc.
Semiconductors--Defects--Handbooks, manuals, etc.