Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen
Tipo de material: TextoSeries NATO advanced study institutes, Physics. Series B ; ; v. 63Detalles de publicación: New York, N.Y : Plenum Press, c1980 Descripción: xxvi, 589 p : ill ; 26 cmISBN: 0-306-40628-4; 0306406284Tema(s): Crystals -- Defects -- Congresses | X-ray crystallography -- Congresses | Cristales -- Defectos | Cristalografía por Rayos XTipo de ítem | Biblioteca de origen | Signatura | URL | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
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Monografías | 02. BIBLIOTECA CAMPUS PUERTO REAL | 548.4/NAT/cha (Navegar estantería(Abre debajo)) | Texto completo | Prestado | 31/01/2025 | 3700105240 |
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"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index
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