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1. Contamination control in trace element analysis / Morris Zief, James W. Mitchell by Zief, Morris Material type Libro Publication: New York ; | London : Wiley, 1976 Physical description: xv,262p : 24cm Availability: No items available:

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2. Metal impurities in silicon-device fabrication / Klaus Graff by Graff, Klaus, Material type Libro; Format: impreso Publication: New York : Springer, 1999 Physical description: p. cm Availability: Items available: 03. BIBLIOTECA INGENIERÍA PUERTO REAL [Depósito-621.315.5/GRA/met] (1),

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