Electron microdiffraction / J.C.H. Spence and J.M. Zuo

Por: Spence, J.C.HColaborador(es): Zuo, J.M [coautor]Tipo de material: Texto

TextoDetalles de publicación: New York : Plenum Press, 1992 Descripción: 358 p. : gráf. ; 25 cmISBN: 0-306-44262-0Tema(s): Películas delgadas -- Propiedades ópticas | Óptica cristalográfica | Electrones -- Difracción | Química del estado sólidoResumen: This comprehensive and practical book offers a concise summary of the current theory and practice of this important microscopy technique. An extensive listing of materials is included as well as several FORTRAN programs and the PostScript code to allow printing of Holz line patterns on a laser printer. The readable text makes this volume valuable for both researchers and graduate students.Resumen: INDICE: A brief history of electron microdiffraction. The geometry of CBED patterns. Theory. The measurement of Low-Order structure factors and thickness. Applications of three-and many-beam theory. Large-angle methods. Symmetry determination. Coherent nanoprobes. STEM. Defects and amorphous materials. Instrumentation and experiemtnal technique.

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This comprehensive and practical book offers a concise summary of the current theory and practice of this important microscopy technique. An extensive listing of materials is included as well as several FORTRAN programs and the PostScript code to allow printing of Holz line patterns on a laser printer. The readable text makes this volume valuable for both researchers and graduate students.

INDICE: A brief history of electron microdiffraction. The geometry of CBED patterns. Theory. The measurement of Low-Order structure factors and thickness. Applications of three-and many-beam theory. Large-angle methods. Symmetry determination. Coherent nanoprobes. STEM. Defects and amorphous materials. Instrumentation and experiemtnal technique.

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